Welcome to your TEM Testing laboratory on the web

Here you can learn about what we can do for you

Timely TEM Services

We can turn around your TEM sample in a day or two with priority support, or about one week with normal support. Either way you get numerous crisp & clear TEM images and a brief, but comprehensive analysis report. That's responsive service.

Saving you money

We keep our overhead costs low, so we can pass the savings on to you. We offer great introductory rates and volume discounts that can save you a significant amount of money. We haelp you stretch your budget dollars.

Win/Win relationships

We want to establish and maintain long-term, mutually beneficial relationships with our clients. This will insure your success, as well as ours. Our clients' continuing success is the foundation of our company.

Helping you hit your targets

We are committed to helping you to meet your targets. Whether that means helping you enhance your yield so you can hit your production targets, or by helping you further your research endeavors. We will be there by your side, working with you.

Your satisfaction is 100% guaranteed or we won't send you a bill!  Read more

TEM Analysis Services

TEM imaging (or TEM testing), uses high energy electrons (usually 100-300kV) that are transmitted through an electron transparent sample. Instead of using visible light, a TEM makes use of these high energy electrons to form an image. In order to image a sample in the TEM, the sample must be thin enough to be electron transparent (about 80-100 nm thick). For nanoparticle samples, this is not a problem. This is because nanoparticles have relatively small diameters (1 to 100 nm). At these relatively small diameters, nanoparticles are usually electron transparent and do not require any thinning. In order to prepare nanoparticle samples for TEM imaging analysis, nanoparticles which are in a solvent, are usually agitated by ultrasonication and then pipetted onto a TEM support grid and subsequently examined after the liquid evaporates. The ultrasonic agitation from the ultrasonic cleaner makes certain that the particles are well-disbursed and that the nanoparticles are randomly distributed when the liquid evaporates from the TEM support grid.

Bulk materials, such as semiconductors, metals, alloys, plastics and glasses, etc., however, must be thinned to electron transparency. The thinning process generally requires a great deal of skill and experience by the analyst in order to prepare a robust TEM sample that is thin enough and free of artifacts and will hold up to handling. The optimum thickness of a TEM sample somewhat depends upon the composition of a material. Generally, the higher the atomic number, the thinner the sample needs to thinned be in order to be electron transparent. If a TEM sample is too thick, there will be other factors at play, such as chromatic aberration, which will make the image of the sample appear to be unclear. Alternatively, a sample would be considered too thin if there is insufficient thickness to generate enough contrast, which will cause the sample appear almost featureless and have a "washed out" appearance.

There are several ways to thin a sample to electron transparency, techniques include, mechanical thinning/dimpling/ion polishing, chemical etching, ultramicrotomy and FIB sectioning. We use the best technique for your particular sample. We consider cost, ease of preparation and the possibility of creating artifacts. Rest assured we will prepare your sample using, based on our experience, what we believe to be the best approach.

Types of TEM Analysis testing

Almost any material can be imaged using the TEM, some examples include:

    • Nanoparticles
    • Metals, including metal alloys
    • Ceramics
    • Composite materials
    • Semiconductors, including Si, GaAs, GaN, SiC
    • Semiconductor devices
    • Quantum wells
    • Laser diodes
    • Nano rods
    • SWCNT (Single-walled Carbon Nanotubes)
    • MWCNT (Multi-walled Carbon Nanotubes)
    • Small particles
    • Soot particles
    • Glasses
    • Interfaces of metals, glasses, plastics
    • Plastics
    • Biological materials, such as virus particles, bacteria, cells, cell organelles

What is TEM Analysis useful for?

TEM is unparalleled in the breadth of info that you can obtain from a sample:

    • Nanoparticle sizing and distribution
    • Morphology studies
    • Elemental distribution studies using EDS, EELS or HAADF
    • HRTEM (lattice) imaging
    • Research of new materials
    • Study of effects of processing on structure and morphology
    • Accurate measurement of thickness of thin films or film stacks
    • Grain size analysis
    • Precipitate distribution analysis
    • Phase identification
    • Failure analysis studies
    • To gain deeper understanding of the failure mechanism
    • Good versus bad comparisons of semiconductor devices, materials, etc.
    • Study interplanar spacing
    • Study interfaces in fine detail
    • Defect density studies
    • Crystal quality studies

What can we do for you?

Just take a look below
Tecnai TEM microscope

State-of-the-art TEM Services

EDS spectroscopy/HAADF STEM
Tecnai TEM viewing chamber

HRTEM imaging

Lattice imaging
Light Microscope

Imaging sample in light microscope prior to TEM sample preparation

Quality TEM Analysis Services
Semiconductor Technician

Semiconductor manufacturing support

Plan view/TEM cross-sections of defects
Nanoparticle delivery pipettes

Nanoparticle sizing analysis

Pipettes for TEM nanoparticle analysis
Cleanroom  technician holding semiconductor wafer

Semiconductor wafer

Timely TEM Analysis of Semiconductors
  • Thank you so much for very beautiful TEM images!!Taisuke Isano, PhD Program Manager, Canon USA
  • Pictures look great, thanks for the very quick turn!Chris Vineis, VP of Core Technology, SiOnyx Inc.
  • The images are just perfect, Thank You!Wen Zhang, PhD. Georgia Institute of Technology
  • Great images! Thank you very much!Hong Lu, PhD. UC, Santa Barbara
  • Thanks again for your help--everyone in my group was impressed with the quality of the [TEM] images. S. Walker, GRA, University of Texas, Austin