Welcome to your TEM Analysis Laboratory on the web

Here you can learn about what we can do for you

Timely TEM Analysis

We can turn around your TEM sample in a day or two with priority support, or about one week with normal support. Either way you get numerous crisp & clear TEM analysis images and a brief, but comprehensive TEM analysis report.

Saving you money

We keep our overhead costs lower, so we can pass the savings on to you. Save a significant part of your budget by having us perform TEM analysis and imaging for you, rather than with one of the huge, expensive "Megalabs".

Win/Win relationships

We want to establish and maintain long-term, mutually beneficial relationships with our clients. This will insure your success, as well as ours. Our clients' continuing success is the foundation of our company.

Helping you hit your targets

We are committed to helping you to meet your targets. Whether that means helping you enhance your yield so you can hit your production targets, or by helping you further your research using TEM Analysis. We'll be there by your side, with you.

Your satisfaction is 100% guaranteed or we won't send you a bill!  Read more

TEM Imaging

TEM imaging, which uses high energy electrons (usually 100-300kV) that are transmitted through an electron transparent sample. Instead of using visible light, a TEM makes use of these high energy electrons to form an image. In order to image a sample in the TEM, the TEM sample must be thin enough to be electron transparent (about 80-100 nm thick). For nanoparticle samples, this is not a problem. This is because nanoparticles have relatively small diameters (1 to 100 nm). At these small diameters, nanoparticles are usually electron transparent and do not require any thinning. In order to prepare nanoparticle samples for TEM imaging analysis, nanoparticles that are in a solvent, are usually agitated by ultrasonication and then pipetted onto a TEM support grid and examined after the liquid evaporates. The ultrasonic agitation from the ultrasonic cleaner makes certain that the particles are well-disbursed and that the nanoparticles are randomly distributed when the liquid evaporates from the TEM support grid.

Bulk materials, such as semiconductors, metals, alloys, plastics and glasses, etc. however, must be thinned to electron transparency. The thinning process generally requires a great deal of skill and experience by the analyst in order to prepare a robust TEM sample that is thin enough and free of artifacts and will hold up to handling. The optimum thickness of a TEM sample somewhat depends upon the composition of a material. Generally, the higher the atomic number, the thinner the sample needs to thinned be in order to be electron transparent. If a TEM sample is too thick, there will be other factors at play, such as chromatic aberration, which will make the image of the sample appear to be unclear. Alternatively, a sample would be considered too thin if there is insufficient thickness to generate enough contrast, which will cause the sample appear practically featureless and have a "washed out" appearance.

There are several ways to thin a sample to electron transparency, techniques include, mechanical thinning/dimpling/ion polishing, chemical etching, ultramicrotomy and FIB sectioning. We use the best technique for your particular sample. We consider cost, ease of preparation and the possibility of creating artifacts. Rest assured we will prepare your sample using, based on our experience, what we believe to be the best approach.

Types of TEM Analysis testing

Almost any material can be imaged using the TEM, some examples include:

    • Nanoparticles
    • Metals, including metal alloys
    • Ceramics
    • Composite materials
    • Semiconductors, including Si, GaAs, GaN, SiC
    • Semiconductor devices
    • Quantum wells
    • Laser diodes
    • Nano rods
    • SWCNT (Single-walled Carbon Nanotubes)
    • MWCNT (Multi-walled Carbon Nanotubes)
    • Small particles
    • Soot particles
    • Glasses
    • Interfaces of metals, glasses, plastics
    • Plastics
    • Biological materials, such as virus particles, bacteria, cells, cell organelles

What is TEM Analysis useful for?

TEM is unequalled in the amount of info that you can obtain from a sample:

    • Nanoparticle sizing and distribution
    • Morphology studies
    • Elemental distribution studies using EDS, EELS or HAADF
    • HRTEM (lattice) imaging
    • Research of new materials
    • Study of effects of processing on structure and morphology
    • Accurate measurement of thickness of thin films or film stacks
    • Grain size analysis
    • Precipitate distribution analysis
    • Phase identification
    • Failure analysis studies
    • To gain deeper understanding of the failure mechanism
    • Good versus bad comparisons of semiconductor devices, materials, etc.
    • Study interplanar spacing
    • Study interfaces in fine detail
    • Defect density studies
    • Crystal quality studies

Sample TEM images

Here is where you can view some sample TEM images from previous projects. You will get an idea of our experience with a wide assortment of materials.

Aluminum-Silicon HR-TEM analysis

Aluminum/Silicon interface in HRTEM

TEM analysis of Gold Nanoparticles

Gold Nanoparticles bright field TEM image

TEM analysis of nanoparticles on TEM support film

Bright field TEM image of Nanoparticles on a TEM support film

TEM analysis of multi walled carbon nanotubes

High Resolution TEM image of Multi-Walled Carbon Nanotubes (MWCNT)

TEM analysis of buried Quantum well

Bright field TEM image of a buried Quantum wells

TEM analysis of drilled Nanohole in metal film

Bright field TEM image of drilled Nanohole in metal film

TEM analysis of diesel engine soot

Bright field TEM image of diesel engine soot

TEM analysis of quantum well in laser device

Bright field TEM image of quantum well in laser device

TEM analysis of mesoporous tungsten oxide (WO3) nanocrystal film on silicon substrate

Bright field TEM image of mesoporous tungsten oxide (WO3) nanocrystal film

TEM analysis of buried arsenic clusters in a GaAs substrate

Bright field TEM image of buried arsenic clusters in a GaAs substrate

TEM analysis of thick buried SiO2 layer in silicon

Bright field TEM image of thick buried SiO2 layer in silicon

TEM analysis of implanted silicon with damaged top layer

Bright field TEM image of implanted silicon with damaged top layer

Cross-sectional bright field TEM analysis of GaAs/InAs device

Cross-sectional bright field TEM image of GaAs/InAs device

TEM analysis of GaAs/InAs quantum dot type device cross-section

Bright field TEM image of GaAs/InAs quantum dot type device cross-section

TEM analysism(cross-sectional) of textured silicon

Bright field TEM cross-sectional image of textured silicon

  • Thank you so much for very beautiful TEM images!!Taisuke Isano, PhD Program Manager, Canon USA
  • Pictures look great, thanks for the very quick turn!Chris Vineis, VP of Core Technology, SiOnyx Inc.
  • The images are just perfect, Thank You!Wen Zhang, PhD. Georgia Institute of Technology
  • Great images! Thank you very much!Hong Lu, PhD. UC, Santa Barbara
  • Thanks again for your help--everyone in my group was impressed with the quality of the [TEM] images. S. Walker, GRA, University of Texas, Austin